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Conference Electronic Imaging / Wavelet Applications in Industrial
Processing VII
San Jose, CA USA
17-21 January 2010
Part of program track on Image Processing
http://spie.org//app/program/index.cfm?fuseaction=conferencedetail&export_id=x16280&ID=x16223&redir=x16223.xml&conference_id=894727&event_id=893861&programtrack_id=896670&jsenabled=1
You can submit your abstract (500 words or more) on the website or you
can send it to the chairs.
Post-Meeting Proceedings Due Dates:
Abstract (500 words or more) : 15 July 2009
Manuscript : 21 December 2009
Conference Chairs:
Frederic Truchetet, Univ. de Bourgogne (France); Olivier Laligant,
Univ. de Bourgogne (France)
Program Committee:
Patrice Abry, École Normale Supérieure de Lyon (France); Akram
Aldroubi, Vanderbilt Univ. (United States);
Jean-Pierre Antoine, Univ. Catholique de Louvain (Belgium); Radu V.
Balan, Univ. of Maryland, College Park (United States);
Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-
Benyahia, Ecole Supérieure des Communications de Tunis (Tunisia);
Albert Bijaoui, Observatoire de la Côte d'Azur (France); Laurent C.
Duval, Institut Français du Pétrole (France);
Wilfried R. Philips, Aleksandra Pizurica, Univ. Gent (Belgium);
Guoping Qiu, The Univ. of Nottingham (United Kingdom);
Hamed Sari-Sarraf, Texas Tech Univ. (United States); Peter Schelkens,
Vrije Univ. Brussel (Belgium);
Paul Scheunders, Univ. Antwerpen (Belgium); Ivan W. Selesnick,
Polytechnic Institute of NYU (United States);
Kenneth W. Tobin, Jr., Oak Ridge National Lab. (United States);
Günther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany);
Gerald Zauner, Fachhochschule Wels (Austria)
The wavelet transform, multiresolution analysis, EMD, and other space-
frequency or space-scale approaches are now considered standard tools
by researchers in image and signal processing. Promising practical
results in machine vision and sensors for industrial applications and
non destructive testing have been obtained, and a lot of ideas can be
applied to industrial imaging projects.
This conference is intended to bring together practitioners,
researchers, and technologists in machine vision, sensors, non
destructive testing, signal and image processing to share recent
developments in wavelet and multiresolution approaches. Papers
emphasizing fundamental methods that are widely applicable to image
processing, industrial inspection and other industrial applications
are especially welcome.
Papers are solicited but not limited to the following areas: New
trends in wavelet and multiresolution approach, frame and overcomplete
representations, Gabor transform, space-scale and space-frequency
analysis, multiwavelets, directional wavelets, lifting scheme,
empirical mode decomposition for:
• sensors
• signal and image denoising, enhancement, segmentation, image
deblurring
• texture analysis
• pattern recognition
• shape recognition
• 3D surface analysis, characterization, compression
• acoustical signal processing
• stochastic signal analysis
• seismic data analysis
• real-time implementation
• image compression
• hardware, wavelet chips
Applications:
• machine vision
• aspect inspection
• character recognition
• speech enhancement
• robot vision
• image databases
• image indexing or retrieval
• data hiding
• image watermarking
• non destructive evaluation
• metrology
• real-time inspection.
Applications in microelectronics manufacturing, web and paper
products, glass, plastic, steel, inspection, power production,
chemical process, food and agriculture, pharmaceuticals, petroleum
industry.
Note: All submissions will be peer reviewed. Please note that
abstracts must be at least 500 words in length in order to receive
full consideration.
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